The WFI soft X-ray Active Pixel Sensor (APS) is in front of the HXI
CdTe detector. Credit: NASA. Click the image for a higher resolution.
Schematic of the DEPFET sensor for the WFI. Credit: NASA. Click the image for a higher resolution.
Preliminary design for a WFI camera head. The wafer scale sensor is integrated within a suspended mount-type assembly. Credit: ESA. Click the image for a higher resolution.
The optics are built up from rectangular cuts of commercial silicon wafers. Click the image for a higher resolution.
The wafers are processed chemomechanically such that ribs remain, providing a thin membrane with ribs of very accurate height and highly
polished surfaces. Click the image for a higher resolution.
Ribbed plates are stacked onto a mandrel that provides the correct starting curvature. Click the image for a higher resolution.
The ribbed plates are then formed a pore structure. Click the image for a higher resolution.